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NEW YORK, NY - MAY 05: Samju Seo, winner of the Dushane Noble FOF Critic Award is seen on the runway during the 2016 Future of Fashion Runway Show at The Fashion Institute of Technology (FIT) on May 5, 2016 in New York City. (Photo by Slaven Vlasic/Getty Images for FIT)
NEW YORK, NY - MAY 05: Cemille Simsek, winner of the Sachin Ahluwalia FOF Critic Award is seen on the runway during the 2016 Future of Fashion Runway Show at The Fashion Institute of Technology (FIT) on May 5, 2016 in New York City. (Photo by Slaven Vlasic/Getty Images for FIT)
NEW YORK, NY - MAY 05: Alexis Chung, winner of the Jason Mahler and Annalise Frank FOF Critic Award is seen on the runway during the 2016 Future of Fashion Runway Show at The Fashion Institute of Technology (FIT) on May 5, 2016 in New York City. (Photo by Slaven Vlasic/Getty Images for FIT)
NEW YORK, NY - MAY 05: Emily Jung, winner of the Oskar Metsavaht FOF Critic Award is seen on the runway during the 2016 Future of Fashion Runway Show at The Fashion Institute of Technology (FIT) on May 5, 2016 in New York City. (Photo by Slaven Vlasic/Getty Images for FIT)
NEW YORK, NY - MAY 05: Kualing Ko, winner of an FOF Critic Award (R) is seen on the runway at the 2016 Future of Fashion Runway Show at The Fashion Institute of Technology (FIT) on May 5, 2016 in New York City. (Photo by Slaven Vlasic/Getty Images for FIT)
NEW YORK, NY - MAY 05: Namibia Viera Martinez, the winner of FOF Critic Award is seen on the runway during the 2016 Future of Fashion Runway Show at The Fashion Institute of Technology (FIT) on May 5, 2016 in New York City. (Photo by Slaven Vlasic/Getty Images for FIT)
NEW YORK, NY - MAY 05: Model Shaun Ross (R) attends the 2016 Future of Fashion Runway Show at The Fashion Institute of Technology (FIT) on May 5, 2016 in New York City. (Photo by Matthew Eisman/Getty Images for FIT)
NEW YORK, NY - MAY 05: Designer and FOF Critic Stacey Bendet and Head Women's Designer at Calvin Klein, Francisco Costa attend the 2016 Future of Fashion Runway Show at The Fashion Institute of Technology (FIT) on May 5, 2016 in New York City. (Photo by Matthew Eisman/Getty Images for FIT)











